Title :
Improved Built-In Self-Test of Sequential Circuits
Author :
Jabbari, Hosna ; Muzio, Jon C. ; Sun, Lin
Author_Institution :
Univ. of British Columbia, Vancouver
Abstract :
In this paper, we present a new class of one-dimensional cellular automata (which can be considered as a special case of a two dimensional cellular automata) that shows better pseudo-randomness properties based on Knuth´s empirical tests than linear hybrid cellular automata and linear feedback shift register. A theorem is given to calculate the number of distinct transitions and the effectiveness of our proposed cellular automata is investigated by using them as test pattern generators for built-in self-test of the ISCAS 89 benchmark circuits. Our experimental results show that our cellular automata produce better sequential fault coverage than linear feedback shift register and linear hybrid cellular automata.
Keywords :
built-in self test; cellular automata; fault diagnosis; logic design; sequential circuits; system-on-chip; ISCAS 89 benchmark circuit; built-in self-test; fault coverage; linear feedback shift register; one-dimensional cellular automata; pseudo-randomness property; sequential circuit; system-on-chip design; test pattern generator; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer science; Linear feedback shift registers; Sequential analysis; Sequential circuits; System testing; Test pattern generators;
Conference_Titel :
Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
1-4244-1020-7
Electronic_ISBN :
0840-7789
DOI :
10.1109/CCECE.2007.27
