Improved Built-In Self-Test of Sequential Circuits

Author

Jabbari, Hosna ; Muzio, Jon C. ; Sun, Lin

Author_Institution

Univ. of British Columbia, Vancouver

fYear

2007

fDate

22-26 April 2007

Firstpage

78

Lastpage

81

Abstract

In this paper, we present a new class of one-dimensional cellular automata (which can be considered as a special case of a two dimensional cellular automata) that shows better pseudo-randomness properties based on Knuth´s empirical tests than linear hybrid cellular automata and linear feedback shift register. A theorem is given to calculate the number of distinct transitions and the effectiveness of our proposed cellular automata is investigated by using them as test pattern generators for built-in self-test of the ISCAS 89 benchmark circuits. Our experimental results show that our cellular automata produce better sequential fault coverage than linear feedback shift register and linear hybrid cellular automata.

Keywords

built-in self test; cellular automata; fault diagnosis; logic design; sequential circuits; system-on-chip; ISCAS 89 benchmark circuit; built-in self-test; fault coverage; linear feedback shift register; one-dimensional cellular automata; pseudo-randomness property; sequential circuit; system-on-chip design; test pattern generator; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer science; Linear feedback shift registers; Sequential analysis; Sequential circuits; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on

Conference_Location

Vancouver, BC

ISSN

0840-7789

Print_ISBN

1-4244-1020-7

Electronic_ISBN

0840-7789

Type

conf

DOI

10.1109/CCECE.2007.27

Filename

4232686