Title :
Costs and Unreliability Minimization of Transmission System Shield Wires
Author :
Kannan, T.N. ; Davey, J. ; Rastgoufard, P. ; Bian, J.H.
Author_Institution :
Department of Electrical Engineering, Tulane University, New Orleans, LA
Keywords :
Circuit analysis computing; Concurrent computing; Conductivity; Costs; Coupling circuits; Impedance; Packaging; Poles and towers; Power engineering computing; Wires;
Conference_Titel :
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
Print_ISBN :
0-8186-2665-8
DOI :
10.1109/SSST.1992.712265