Title :
An Efficient Approach to Diagnosis of Wiring Interconnect Faults
Author :
Melton, Matthew ; Brglez, Franc
Author_Institution :
IBM, Research Triangle Park, N.C.
Keywords :
Circuit faults; Costs; Fault detection; Fault diagnosis; Integrated circuit interconnections; Logic; Performance evaluation; Test pattern generators; Testing; Wiring;
Conference_Titel :
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
Print_ISBN :
0-8186-2665-8
DOI :
10.1109/SSST.1992.712272
