Title :
Measurement of Degradation Properties of Dielectric Materials Used on Spacecraft Power Systems
Author :
Kothari, I.K. ; Doreswamy, C.V. ; Shen, Zhi Fang
Author_Institution :
Tuskegee University, Alabama
Keywords :
Aircraft manufacture; Capacitance measurement; Conductivity; Degradation; Dielectric materials; Dielectric measurements; Pollution measurement; Power measurement; Power system measurements; Volume measurement;
Conference_Titel :
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
Print_ISBN :
0-8186-2665-8
DOI :
10.1109/SSST.1992.712281
