• DocumentCode
    2808853
  • Title

    Measurement of Degradation Properties of Dielectric Materials Used on Spacecraft Power Systems

  • Author

    Kothari, I.K. ; Doreswamy, C.V. ; Shen, Zhi Fang

  • Author_Institution
    Tuskegee University, Alabama
  • fYear
    1992
  • fDate
    1-3 Mar 1992
  • Firstpage
    290
  • Lastpage
    293
  • Keywords
    Aircraft manufacture; Capacitance measurement; Conductivity; Degradation; Dielectric materials; Dielectric measurements; Pollution measurement; Power measurement; Power system measurements; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
  • ISSN
    0094-2898
  • Print_ISBN
    0-8186-2665-8
  • Type

    conf

  • DOI
    10.1109/SSST.1992.712281
  • Filename
    712281