Title :
Analysis of electromagnetic fields in loaded TEM cells by finite element method
Author :
Foo, S.L. ; Costache, G.I. ; Stuchly, S.S.
Author_Institution :
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
Abstract :
The distribution of the electromagnetic field in a transverse-electromagnetic-field (TEM) cell, loaded with various equipment-under-test (EUT), is calculated using the finite-element method (FEM). The calculations are performed for a two-dimensional (2-D) configuration for inhomogeneous dielectric-conductor EUTs of various cross-sectional dimensions. The set of curves obtained provides a means of estimating the uncertainty of the TEM cell measurements and can be used as a quick reference guideline for predicting the maximum dimensions of the EUT for a given field distortion.<>
Keywords :
electromagnetic compatibility; electromagnetic fields; electromagnetic interference; electronic equipment testing; finite element analysis; EMC; EMI; electromagnetic fields; equipment-under-test; field distortion; finite element method; inhomogeneous dielectric-conductor; loaded TEM cells; transverse-electromagnetic-field; two-dimensional conductor configuration; Dielectric losses; Electromagnetic analysis; Electromagnetic fields; Electromagnetic interference; Electromagnetic radiation; Equations; Finite element methods; Impedance; TEM cells; Telephony;
Conference_Titel :
Electromagnetic Compatibility, 1988. Symposium Record., IEEE 1988 International Symposium on
Conference_Location :
Seattle, WA, USA
DOI :
10.1109/ISEMC.1988.14077
