• DocumentCode
    2809415
  • Title

    Design of a fault-tolerant microprocessor: a simulation approach

  • Author

    Lee, Kab Joo ; Choi, Gwan

  • Author_Institution
    Samsung Electron. Inc., Kyungkido, South Korea
  • fYear
    1997
  • fDate
    15-16 Dec 1997
  • Firstpage
    161
  • Lastpage
    166
  • Abstract
    This paper presents an approach for assessing the merits and the cost of incorporating processor-level error detection and recovery mechanisms. The approach is exemplified by implementing several fault-tolerant mechanisms into a 32-bit, MIPS R3000-compatible, RISC microprocessor and conducting simulation-based fault injection experiments. The mechanisms are triple modular redundancy (TMR), retry on duplication-comparison, and retry on parity-checking codes. Reliability gains and performance/area overheads are quantitatively evaluated for each error-detection/recovery scheme. The fault injection analysis results indicate that the highest fault coverage is achieved with the code-based retry technique
  • Keywords
    fault tolerant computing; microprocessor chips; redundancy; reliability; virtual machines; MIPS R3000-compatible; RISC microprocessor; fault injection analysis; fault-tolerant mechanisms; fault-tolerant microprocessor; performance/area overheads; processor-level error detection; recovery mechanisms; reliability gains; retry on duplication-comparison; retry on parity-checking; simulation; simulation-based fault injection; triple modular redundancy; Analytical models; Circuit faults; Circuit simulation; Fault tolerance; Fault tolerant systems; Hardware; Microprocessors; Performance analysis; Pipelines; Reduced instruction set computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Systems, 1997. Proceedings., Pacific Rim International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    0-8186-8212-4
  • Type

    conf

  • DOI
    10.1109/PRFTS.1997.640142
  • Filename
    640142