DocumentCode
2809423
Title
Diffraction by a symmetric material junction. II. Resolution of the muon-uniqueness
Author
Ricoy, M.A. ; Volakis, J.L.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear
1991
fDate
24-28 June 1991
Firstpage
542
Abstract
For pt.I see ibid., p.538 (1991). A Weiner-Hopf solution for the diffraction by a multilayer material-to-material junction using a GSTC (generalized sheet transition condition) simulation of the multilayer slab was previously presented. This solution was in terms of unknown constants, and it was shown that these are dependent on the physical properties of the junction. Consequently, an approach for determining the solution constants is to enforce tangential field continuity across the junction, which implies a knowledge of the fields internal to the discontinuous slab, not yielded from the Wiener-Hopf solution. To overcome this, the authors use a model expansion, making it possible to recast the previously obtained Weiner-Hopf solution in a form permitting the identification of the fields internal to the slab. By enforcing field continuity across the junction, a set of linear equations for the unknown constants can be generated.<>
Keywords
electromagnetic wave diffraction; Weiner-Hopf solution; discontinuous slab; generalized sheet transition condition; linear equations; model expansion; multilayer junction; multilayer slab; physical properties; simulation; solution constants; symmetric material junction; tangential field continuity; Diffraction; Geometrical optics; Optical surface waves; Partial differential equations; Permeability; Permittivity; Polarization; Refractive index; Slabs; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1991. AP-S. Digest
Conference_Location
London, Ontario, Canada
Print_ISBN
0-7803-0144-7
Type
conf
DOI
10.1109/APS.1991.174897
Filename
174897
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