DocumentCode
2809508
Title
Multiple scattering from two semi-circular bosses above the conducting plane
Author
Eom, Hyo J. ; Hur, Gui Y.
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fYear
1991
fDate
24-28 June 1991
Firstpage
554
Abstract
The behavior of electromagnetic scattering from two unidentical semicircular bosses above a conducting half-space is investigated. Image theory is used to account for the specular reflection from the infinitely extended half space. Both incident and scattered fields are expanded in a Fourier series of azimuth angles with unknown coefficients. By enforcing the boundary conditions of the tangential E and H field continuity along two perfectly conducting circular cylinders, the expressions for the scattered fields are obtained. Numerical computations are performed to examine the bistatic and backscattering angular behavior of scattering coefficients, and their results are compared to single-scattering-approximated results. The relative importance of multiple scattering from two bumps is discussed in terms of bump-size, spacing, polarization, and operating frequency.<>
Keywords
boundary-value problems; conductors (electric); electromagnetic wave reflection; electromagnetic wave scattering; Fourier series; H field continuity; azimuth angles; backscattering; bistatic behavior; boundary conditions; bump-size; bumps; conducting half-space; conducting plane; electromagnetic scattering; image theory; incident field; multiple scattering; operating frequency; perfectly conducting circular cylinders; polarization; scattered fields; scattering coefficients; semicircular bosses; spacing; specular reflection; tangential E field continuity; Azimuth; Backscatter; Boundary conditions; Electromagnetic reflection; Electromagnetic scattering; Engine cylinders; Equations; Fourier series; Space technology; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1991. AP-S. Digest
Conference_Location
London, Ontario, Canada
Print_ISBN
0-7803-0144-7
Type
conf
DOI
10.1109/APS.1991.174900
Filename
174900
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