Title :
Testing of domino and latched domino circuits using current sensors
Author :
Roberts, Moiien W. ; Reipold, Anthony M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA
Abstract :
Several types of faults that can occur in domino and latched domino (LDomino) logic are analyzed. The faults considered include: stuck-open, stuck-close, bridging and gate substrate faults. A current monitor that detects these faults is proposed. The monitor adds very little overhead when appended to a complex logic function implemented in domino or LDomino
Keywords :
fault location; logic circuits; logic testing; bridging faults; complex logic function; current monitor; gate substrate faults; latched domino circuits; stuck-close; stuck-open; Circuit faults; Circuit testing; Computerized monitoring; Condition monitoring; Current supplies; Electrical fault detection; Fault detection; Logic circuits; Performance evaluation; Remote monitoring;
Conference_Titel :
Circuits and Systems, 1990., Proceedings of the 33rd Midwest Symposium on
Conference_Location :
Calgary, Alta.
Print_ISBN :
0-7803-0081-5
DOI :
10.1109/MWSCAS.1990.140783
