• DocumentCode
    2809741
  • Title

    The improvement on the measuring precision of detecting fault composite insulators by using electric field mapping

  • Author

    Li, Ming ; Li, Chengrong ; Chen, Yangchun

  • Author_Institution
    Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China
  • fYear
    2005
  • fDate
    16-19 Oct. 2005
  • Firstpage
    285
  • Lastpage
    288
  • Abstract
    According to the statistics of the fault composite insulators, most of the defects take place at the high voltage (HV) end of the insulators. At present, the minimum defect length detected possibly at HV end of the insulators is about 7 cm by using electric field mapping device, which could not indicate the defects located between the last shed and the HV electrode. Therefore, it is important to improve the measuring precision that is suitable for indicating the defects less than 7 cm in inspecting the fault composite insulators based on electric field mapping device. In order to enhance the measuring precision of the device, we analyzed the electric field distribution along with an insulator by using the commercial software ANSYS. We found that a 5 cm defect can be found if we collect two to three electric field data between the two sheds. Therefore, we added a photoelectric cell array to trigger the device for collecting more data between the two sheds. The tests were conducted in our laboratory by using our new device. The results from our experiments show that the sensitivity of detecting the defects is increased and our new device can indicate the defects less than 5 cm at the HV end without grading rings.
  • Keywords
    composite insulators; fault location; high-voltage techniques; insulator testing; photoelectric cells; power engineering computing; HV electrode; commercial software ANSYS; electric field distribution; electric field mapping; fault composite insulator; fault detection; high voltage defect; photoelectric cell array; precision measurement; sensitivity; triggering device; Computational modeling; Detectors; Dielectrics and electrical insulation; Electric variables measurement; Electrical fault detection; Electrodes; Electromagnetic compatibility; Laboratories; Statistics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
  • Print_ISBN
    0-7803-9257-4
  • Type

    conf

  • DOI
    10.1109/CEIDP.2005.1560677
  • Filename
    1560677