DocumentCode
2809741
Title
The improvement on the measuring precision of detecting fault composite insulators by using electric field mapping
Author
Li, Ming ; Li, Chengrong ; Chen, Yangchun
Author_Institution
Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China
fYear
2005
fDate
16-19 Oct. 2005
Firstpage
285
Lastpage
288
Abstract
According to the statistics of the fault composite insulators, most of the defects take place at the high voltage (HV) end of the insulators. At present, the minimum defect length detected possibly at HV end of the insulators is about 7 cm by using electric field mapping device, which could not indicate the defects located between the last shed and the HV electrode. Therefore, it is important to improve the measuring precision that is suitable for indicating the defects less than 7 cm in inspecting the fault composite insulators based on electric field mapping device. In order to enhance the measuring precision of the device, we analyzed the electric field distribution along with an insulator by using the commercial software ANSYS. We found that a 5 cm defect can be found if we collect two to three electric field data between the two sheds. Therefore, we added a photoelectric cell array to trigger the device for collecting more data between the two sheds. The tests were conducted in our laboratory by using our new device. The results from our experiments show that the sensitivity of detecting the defects is increased and our new device can indicate the defects less than 5 cm at the HV end without grading rings.
Keywords
composite insulators; fault location; high-voltage techniques; insulator testing; photoelectric cells; power engineering computing; HV electrode; commercial software ANSYS; electric field distribution; electric field mapping; fault composite insulator; fault detection; high voltage defect; photoelectric cell array; precision measurement; sensitivity; triggering device; Computational modeling; Detectors; Dielectrics and electrical insulation; Electric variables measurement; Electrical fault detection; Electrodes; Electromagnetic compatibility; Laboratories; Statistics; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
Print_ISBN
0-7803-9257-4
Type
conf
DOI
10.1109/CEIDP.2005.1560677
Filename
1560677
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