DocumentCode
280989
Title
Applications and onward development of ANSI/IEEE Std 1149.1
Author
Maunder, C.
Author_Institution
British Telecom Res. Lab., Ipswich
fYear
1990
fDate
33226
Firstpage
42370
Lastpage
42376
Abstract
Many companies, encouraged by the recent introduction of ANSI/IEEE Standard 1149.1 are starting to use boundary-scan techniques for testing loaded PWBs. Applications and future developments of this standard are discussed
Keywords
automatic testing; logic testing; printed circuit testing; standards; ANSI/IEEE Standard 1149.1; boundary-scan techniques; future developments; loaded PWBs; testing;
fLanguage
English
Publisher
iet
Conference_Titel
Application and Development of the Boundary-Scan Standard, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
191482
Link To Document