DocumentCode :
2810609
Title :
Welcome message
fYear :
2012
fDate :
5-8 Nov. 2012
Firstpage :
1
Lastpage :
1
Abstract :
Presents the welcome message from the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4673-1594-4
Type :
conf
DOI :
10.1109/TEST.2012.6401517
Filename :
6401517
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2810609
