DocumentCode
2810903
Title
The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor
Author
McLaurin, T. ; Frederick, F. ; Slobodnik, R.
Author_Institution
ARM Austin, Austin, TX, USA
fYear
2012
fDate
5-8 Nov. 2012
Firstpage
1
Lastpage
9
Abstract
The DFT and test challenges faced, and the solutions applied, to the Cortex-A15 microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT flow that addresses multiple identical CPUs that will ultimately end up in many different design and test environments. We describe work done with EDA vendors to ensure that all mutual customers are able to implement this flow. In addition, this paper discusses the use of the ARM MBIST standardized interface in conjunction with a 3rd party MBIST controller for the first time. We collaborated closely with the 3rd party tool company and met all of the challenges to get this first time flow and tool capability working successfully on silicon.
Keywords
discrete Fourier transforms; elemental semiconductors; integrated circuit testing; microprocessor chips; silicon; 3rd party MBIST controller; 3rd party tool company; ARM Cortex-A15 microprocessor; ARM MBIST standardized interface; DFT flow technique; EDA vendor; Si; multiple identical CPU; test environment; Automatic test pattern generation; Clocks; Delay; Discrete Fourier transforms; Microprocessors; Program processors; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1089-3539
Print_ISBN
978-1-4673-1594-4
Type
conf
DOI
10.1109/TEST.2012.6401534
Filename
6401534
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