• DocumentCode
    2810903
  • Title

    The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor

  • Author

    McLaurin, T. ; Frederick, F. ; Slobodnik, R.

  • Author_Institution
    ARM Austin, Austin, TX, USA
  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The DFT and test challenges faced, and the solutions applied, to the Cortex-A15 microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT flow that addresses multiple identical CPUs that will ultimately end up in many different design and test environments. We describe work done with EDA vendors to ensure that all mutual customers are able to implement this flow. In addition, this paper discusses the use of the ARM MBIST standardized interface in conjunction with a 3rd party MBIST controller for the first time. We collaborated closely with the 3rd party tool company and met all of the challenges to get this first time flow and tool capability working successfully on silicon.
  • Keywords
    discrete Fourier transforms; elemental semiconductors; integrated circuit testing; microprocessor chips; silicon; 3rd party MBIST controller; 3rd party tool company; ARM Cortex-A15 microprocessor; ARM MBIST standardized interface; DFT flow technique; EDA vendor; Si; multiple identical CPU; test environment; Automatic test pattern generation; Clocks; Delay; Discrete Fourier transforms; Microprocessors; Program processors; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4673-1594-4
  • Type

    conf

  • DOI
    10.1109/TEST.2012.6401534
  • Filename
    6401534