Title :
Degradation of oxide cathode properties in vacuum diode configuration
Author :
Gärtner, G. ; Weon, B.M. ; Barrat, D.
Author_Institution :
Philips Res. Lab., Aachen, Germany
Abstract :
In this paper we investigate the oxide cathode life limiting effects on the basis of accelerated life predictions. In the diode accelerated life tests we found as a typical behaviour not only a shift of the space charge limit corresponding to a change of the diode distance, but also a continuous decrease of the space charge slope form an initial value of 1.46 to 1.40 and even below. We also investigate the sintering shrinkage and I/U characteristics of oxide coating as a function of operating time.
Keywords :
cathode-ray tubes; diodes; electron guns; electron tube testing; life testing; oxide coated cathodes; shrinkage; sintering; space charge; vacuum tubes; I/U plot; accelerated life predictions; diode accelerated life tests; oxide cathode degradation properties; oxide cathode life limiting effects; sintering shrinkage; space charge limit; vacuum diode configuration; Acceleration; Cathode ray tubes; Degradation; Diodes; Displays; Life estimation; Life testing; Space charge; Temperature; Voltage;
Conference_Titel :
Vacuum Electronics, 2003 4th IEEE International Conference on
Print_ISBN :
0-7803-7699-4
DOI :
10.1109/IVEC.2003.1286333
