DocumentCode :
2811005
Title :
Probabilistic Pattern Matching in KIMS Inspection Expert System
Author :
Ntuen, Celestine A. ; Park, Eui H. ; Kim, Jung H.
Author_Institution :
Department of Electrical Engineering NC A&T State University, NC
fYear :
1992
fDate :
1-3 Mar 1992
Firstpage :
473
Lastpage :
476
Keywords :
Character recognition; Diagnostic expert systems; Expert systems; Feature extraction; Histograms; Image segmentation; Inspection; Layout; Medical expert systems; Pattern matching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
ISSN :
0094-2898
Print_ISBN :
0-8186-2665-8
Type :
conf
DOI :
10.1109/SSST.1992.712337
Filename :
712337
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2811005
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