Title :
Material Characterization of Arbitrarily Shaped Dielectrics Based on Reflected Pulse Characteristics
Author :
Chan, Kevin K. M. ; Tan, Adrian Eng-Choon ; Lin Li ; Rambabu, Karumudi
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Alberta, Edmonton, AB, Canada
Abstract :
The relative permittivity of materials is extracted using time domain radar pulse reflection measurements. The pulse reflected from an arbitrarily shaped dielectric object is compared with that reflected from its metallic equivalent to determine the object´s dielectric constant. The proposed method achieves accuracies of over 85% for permittivity and within 2 mm for material thickness estimations. Using the proposed technique, the complex relative permittivity for various objects is extracted over a frequency range from 3 to 10 GHz. This method has been applied to determine the permittivity of a ridge of sand and to dielectric imaging.
Keywords :
dielectric materials; estimation theory; materials testing; microwave materials; radar applications; time-domain analysis; arbitrarily shaped dielectric object; dielectric constant; dielectric imaging; frequency 3 GHz to 10 GHz; material characterization; material thickness estimations; metallic equivalent; reflected pulse characteristics; relative permittivity; time domain radar pulse reflection measurements; Antenna measurements; Dielectric measurement; Dielectrics; Frequency measurement; Metals; Permittivity; Pulse measurements; Arbitrarily shaped object characterization; dielectric material characterization; radar cross section (RCS) measurements; relative permittivity characterization; remote material characterization; time-domain RCS;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2015.2418199