• DocumentCode
    2811248
  • Title

    Event-driven framework for configurable runtime system observability for SOC designs

  • Author

    Jong Chul Lee ; Kouteib, F. ; Lysecky, Roman

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The deep integration of software and hardware components within complex system-on-chip (SOC) designs prevents the use of traditional analysis and debug methods to observe the internal state of these components. This situation is further exacerbated for in-situ debugging, verification, and certification efforts in which physical access to traditional debug and trace interfaces is unavailable, infeasible, or cost prohibitive. In this paper, we present an overview of an event-driven system-level observation framework that provides low-overhead methods for observing and analyzing designer specified hardware and software events at runtime.
  • Keywords
    electronic engineering computing; hardware-software codesign; logic design; system-on-chip; SOC design; certification; configurable runtime system observability; debugging; event-driven system-level observation; hardware component; low-overhead method; software component; system-on-chip; verification; Debugging; Hardware; Monitoring; Runtime; Software; System-on-a-chip; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4673-1594-4
  • Type

    conf

  • DOI
    10.1109/TEST.2012.6401554
  • Filename
    6401554