DocumentCode
2811248
Title
Event-driven framework for configurable runtime system observability for SOC designs
Author
Jong Chul Lee ; Kouteib, F. ; Lysecky, Roman
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
fYear
2012
fDate
5-8 Nov. 2012
Firstpage
1
Lastpage
10
Abstract
The deep integration of software and hardware components within complex system-on-chip (SOC) designs prevents the use of traditional analysis and debug methods to observe the internal state of these components. This situation is further exacerbated for in-situ debugging, verification, and certification efforts in which physical access to traditional debug and trace interfaces is unavailable, infeasible, or cost prohibitive. In this paper, we present an overview of an event-driven system-level observation framework that provides low-overhead methods for observing and analyzing designer specified hardware and software events at runtime.
Keywords
electronic engineering computing; hardware-software codesign; logic design; system-on-chip; SOC design; certification; configurable runtime system observability; debugging; event-driven system-level observation; hardware component; low-overhead method; software component; system-on-chip; verification; Debugging; Hardware; Monitoring; Runtime; Software; System-on-a-chip; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1089-3539
Print_ISBN
978-1-4673-1594-4
Type
conf
DOI
10.1109/TEST.2012.6401554
Filename
6401554
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