Title :
Reliability modeling under the constraint of specified maximum acceptable service interruptions
Author_Institution :
Sun Microsyst., Itasca, IL, USA
Keywords :
Markov processes; failure analysis; fault tolerant computing; redundancy; reliability theory; workstation clusters; Markov model; cluster failover; fault tolerant computing; redundant system; reliability modeling; switching time; time-redundancy; Electronic equipment; Electronics cooling; Equations; Fault tolerant systems; Frequency; Redundancy; Reliability; Seminars; Sun; Temperature sensors;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408360