DocumentCode
2811731
Title
BS 1149.1 extensions for an online interconnect fault detection and recovery
Author
Sadeghi-Kohan, Somayeh ; Namaki-Shoushtari, Majid ; Javaheri, F. ; Navabi, Zainalabedin
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear
2012
fDate
5-8 Nov. 2012
Firstpage
1
Lastpage
9
Abstract
Loss of signal integrity in today´s deep sub-micron designs puts communication links at a higher risk of permanent or more frequent intermittent faults. This results in performance and reliability reduction. This paper presents an online interconnect BIST method that applies to a hybrid serial/parallel communication scheme. The proposed BIST method is implemented by a simple extension to the boundary scan standard, which facilitates online testing methodology with negligible hardware overhead. The online hardware works in the idle state of the Boundary Scan TAP controller. The proposed method includes fault detection and diagnosis phases. Moreover, for error handling, it uses the same test hardware added to the communication interface. It effectively reuses the existing boundary scan structure to act as a signature generator, an error detector and locater for testing interconnects, and an error handling mechanism. Our method can detect about 90% of the interconnect faults after six block transfers.
Keywords
boundary scan testing; built-in self test; fault diagnosis; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; BS 1149.1 extensions; boundary scan TAP controller; boundary scan standard extension; error detector; error handling mechanism; hybrid serial-parallel communication scheme; interconnect testing; online interconnect BIST method; online interconnect fault detection; online testing methodology; reliability reduction; signal integrity; signature generator; Built-in self-test; Circuit faults; Flip-flops; Hardware; Integrated circuit interconnections; Registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1089-3539
Print_ISBN
978-1-4673-1594-4
Type
conf
DOI
10.1109/TEST.2012.6401583
Filename
6401583
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