• DocumentCode
    2811731
  • Title

    BS 1149.1 extensions for an online interconnect fault detection and recovery

  • Author

    Sadeghi-Kohan, Somayeh ; Namaki-Shoushtari, Majid ; Javaheri, F. ; Navabi, Zainalabedin

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Loss of signal integrity in today´s deep sub-micron designs puts communication links at a higher risk of permanent or more frequent intermittent faults. This results in performance and reliability reduction. This paper presents an online interconnect BIST method that applies to a hybrid serial/parallel communication scheme. The proposed BIST method is implemented by a simple extension to the boundary scan standard, which facilitates online testing methodology with negligible hardware overhead. The online hardware works in the idle state of the Boundary Scan TAP controller. The proposed method includes fault detection and diagnosis phases. Moreover, for error handling, it uses the same test hardware added to the communication interface. It effectively reuses the existing boundary scan structure to act as a signature generator, an error detector and locater for testing interconnects, and an error handling mechanism. Our method can detect about 90% of the interconnect faults after six block transfers.
  • Keywords
    boundary scan testing; built-in self test; fault diagnosis; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; BS 1149.1 extensions; boundary scan TAP controller; boundary scan standard extension; error detector; error handling mechanism; hybrid serial-parallel communication scheme; interconnect testing; online interconnect BIST method; online interconnect fault detection; online testing methodology; reliability reduction; signal integrity; signature generator; Built-in self-test; Circuit faults; Flip-flops; Hardware; Integrated circuit interconnections; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4673-1594-4
  • Type

    conf

  • DOI
    10.1109/TEST.2012.6401583
  • Filename
    6401583