• DocumentCode
    2811740
  • Title

    Reliability prediction through degradation data modeling using a quasi-likelihood approach

  • Author

    Jayaram, J.S.R. ; Girish, T.

  • Author_Institution
    Design Technol. Inst., Singapore
  • fYear
    2005
  • fDate
    Jan. 24-27, 2005
  • Firstpage
    193
  • Lastpage
    199
  • Keywords
    Monte Carlo methods; Poisson distribution; maximum likelihood estimation; process design; product design; product development; time to market; Poisson; confidence band; degradation data modeling; generalized estimating equation; marginal distribution; multivariate Monte Carlo simulation; process design; product design; product development; quasi-likelihood approach; quasilikelihood approach; reliability prediction; time to market; Consumer products; Degradation; Life estimation; Life testing; Performance evaluation; Poisson equations; Predictive models; Process design; Product development; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2005. Proceedings. Annual
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-8824-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2005.1408361
  • Filename
    1408361
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2811740