DocumentCode :
2811793
Title :
Minimize system reliability variability based on six-sigma criteria considering component operational uncertainties
Author :
Jin, Tongdan ; Su, Peter
Author_Institution :
Teradyne Inc., Brandford, MA, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
214
Lastpage :
219
Keywords :
electrical faults; failure analysis; printed circuits; reliability; six sigma (quality); stochastic processes; temperature distribution; PCB; broadband analog board; component operational uncertainties; electrical derating; electrical device failure rate; electrical stress; printed circuit board; six-sigma criteria; stochastic reliability prediction model; temperature distribution; temperature stress; Capacitors; Consumer electronics; Power system reliability; Predictive models; Printed circuits; Resistors; Stochastic processes; Stress; Temperature; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408364
Filename :
1408364
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2811793
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