• DocumentCode
    2811914
  • Title

    An experiment of burn-in time reduction based on parametric test analysis

  • Author

    Sumikawa, N. ; Wang, L.-C. ; Abadir, M.S.

  • Author_Institution
    Univ. of California, Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Burn-in is a common test approach to screen out unreliable parts. The cost of burn-in can be significant due to long burn-in periods and expensive equipment. This work studies the potential of using parametric test data to reduce the time of burn-in. The experiment focuses on developing parametric test models based on test data collected after 10 hours of burn-in to predict parts likely-to-fail after 24 and 48 hours of burn-in. Our study shows that 24-hour and 48-hour burn-in failures behave abnormally in multivariate parametric test spaces after 10 hours of burn-in. Hence, it is possible to develop multivariate test models to identify these likely-to-fail parts early in a burn-in cycle. This study is carried out on 8 lots of test data from a burn-in experiment based on a 3-axis accelerometer design. The study shows that after 10 hours of burn-in, it is possible to identify a large portion of all parts that do not require longer burn-in time, potentially providing significant cost saving.
  • Keywords
    failure analysis; test equipment; 3-axis accelerometer design; burn-in cycle; burn-in experiment; burn-in failures; burn-in periods; burn-in time reduction; cost saving; expensive equipment; multivariate parametric test spaces; parametric test analysis; parametric test data; parametric test models; unreliable parts; Buildings; Data models; Kernel; Predictive models; Support vector machines; Testing; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4673-1594-4
  • Type

    conf

  • DOI
    10.1109/TEST.2012.6401595
  • Filename
    6401595