DocumentCode :
2812022
Title :
AMSAA maturity projection model based on stein estimation
Author :
Ellner, Paul M. ; Hall, J.B.
Author_Institution :
U.S. AMAA, MD, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
271
Lastpage :
277
Keywords :
failure analysis; parameter estimation; reliability; AMSAA; MTBF; Stein estimation; failure modes; fix effectiveness factors; maturity projection model; parameter estimation; reliability projection; Computational modeling; Delay; IEC; Maximum likelihood estimation; Moment methods; Parameter estimation; Prototypes; Reliability; Surface treatment; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408374
Filename :
1408374
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2812022
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