Title :
Static and dynamic performance characterization and comparison of 15 kV SiC MOSFET and 15 kV SiC n-IGBTs
Author :
Gangyao Wang ; Huang, Alex Q. ; Fei Wang ; Xiaoqing Song ; Xijun Ni ; Sei-Hyung Ryu ; Grider, David ; Schupbach, Marcelo ; Palmour, John
Author_Institution :
NSF FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
Abstract :
This paper presents the static and dynamic performance of 15 kV SiC IGBTs with 2 um and 5 um field-stop buffer layer thicknesses respectively and compares them with 15 kV SiC MOSFET in term of loss and switching capability. Their switching energy for different gate resistors and temperature have been reported and compared. A 5 kHz 10.5 kW 8 kV boost converter has been built and tested using these three devices respectively. The MOSFET based boost converter has the highest efficiency 99.39% which is the highest reported efficiency for a high voltage SiC device based converter. PLECS loss models can be developed for these devices based on the characterization data to simplify the simulation of a variety circuits or applications which potentially utilize these devices.
Keywords :
MOSFET circuits; buffer layers; insulated gate bipolar transistors; power convertors; power transistors; semiconductor device models; silicon compounds; wide band gap semiconductors; MOSFET based boost converter; PLECS loss models; SiC; field-stop buffer layer thicknesses; frequency 5 kHz; gate resistors; n-IGBT; power 10.5 kW; size 2 mum; size 5 mum; switching capability; switching energy; voltage 15 kV; voltage 8 kV; Decision support systems; Insulated gate bipolar transistors; Integrated circuits; MOSFET; Power semiconductor devices; Silicon carbide; Switches;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4799-6259-4
DOI :
10.1109/ISPSD.2015.7123431