DocumentCode :
2812232
Title :
Reliability analysis of phased mission systems with common cause failures
Author :
Tang, Zhihua ; Xu, Hong ; Dugan, Joanne Bechta
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
313
Lastpage :
318
Keywords :
binary decision diagrams; fault trees; BDD; binary decision diagram; common cause failure; fault tree; phase algebra; phase dependent failure; phased mission system; reliability analysis; Algebra; Binary decision diagrams; Boolean functions; Data structures; Failure analysis; Fault trees; Large-scale systems; Lightning; Probability; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408381
Filename :
1408381
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2812232
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