DocumentCode
2812269
Title
The study on the test generation of digital circuit on the basis of the GA and the ant colony algorithm
Author
Zhou, Xun ; Wang, Xiaoli
Author_Institution
Acad. of Armored Forces Engineerng, Beijing, China
fYear
2011
fDate
15-17 July 2011
Firstpage
4627
Lastpage
4629
Abstract
A kind of algorithm about the test generation of digital circuit is provided. This method is on the basis of the GA and the ant colony algorithm. Through the rotation call of the two kinds of algorithm, the test generation vector is optimized. From experimental results, this algorithm is feasible.
Keywords
circuit testing; optimisation; ant colony algorithm; digital circuit test generation; rotation call; test generation vector; Algorithm design and analysis; Computers; Digital circuits; Fires; Test pattern generators; Very large scale integration; Ant colony algorithm; Digital circuit; GA; Test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location
Hohhot
Print_ISBN
978-1-4244-9436-1
Type
conf
DOI
10.1109/MACE.2011.5988040
Filename
5988040
Link To Document