Title :
RF power absorption and electric and magnetic field enhancements due to surface roughness
Author :
Zhang, Peng ; Lau, Y.Y. ; Gilgenbach, R.M.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
In this work, we analytically compute the power absorption due to a hemispherical protrusion on a resonant cavity´s surface. The permittivity, conductivity, and permeability of the protrusion may assume arbitrary values. The local field enhancement factors of both electric field and magnetic field on the protrusion are also calculated analytically. These calculations have been spot-checked against the Maxwell-3D code.
Keywords :
cavity resonators; electric fields; electrical conductivity; electromagnetic wave absorption; magnetic fields; magnetic permeability; permittivity; surface roughness; Maxwell-3D code; RF power absorption; conductivity; electric field enhancement; hemispherical protrusion; local field enhancement; magnetic field enhancement; permeability; permittivity; resonant cavity surface; surface roughness; Absorption; Conductivity; Magnetic analysis; Magnetic fields; Magnetic resonance; Permeability; Permittivity; Radio frequency; Rough surfaces; Surface roughness; RF power absorption; electric field enhancement; magnetic field enhancement; surface roughness;
Conference_Titel :
Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3500-5
Electronic_ISBN :
978-1-4244-3501-2
DOI :
10.1109/IVELEC.2009.5193466
