DocumentCode :
2812815
Title :
Structural analysis of Bi doped silica glasses by XAFS
Author :
Okura, T. ; Fujimoto, Y. ; Nakatsuka, M.
fYear :
2005
fDate :
38544
Firstpage :
360
Lastpage :
361
Keywords :
Bismuth; Chemicals; Electromagnetic wave absorption; Fluorescence; Glass; Optical fiber amplifiers; Optical fiber communication; Optical fibers; Silicon compounds; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2005. International
Print_ISBN :
0-7803-9240-X
Type :
conf
DOI :
10.1109/IQEC.2005.1560891
Filename :
1560891
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2812815
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