Title :
Multiple failure mode and effects analysis - an approach to risk assessment of multiple failures with FMEA
Author :
Pickard, Karsten ; Müller, Peter ; Bertsche, Bernd
Author_Institution :
Inst. of Mach. Components, Stuttgart Univ., Germany
Keywords :
Boolean algebra; fault trees; mechatronics; product design; risk analysis; Boolean logic; FMEA; FTA; failure mode and effects analysis; failure networks quantitative information; fault tree analysis; mFMEA; mechatronical systems; multiple failure mode and effects analysis; product design; reliability analysis; risk assessment; systems availability; Control systems; Failure analysis; Fault trees; Machine components; Performance analysis; Product design; Quality function deployment; Risk analysis; Risk management; US Department of Transportation;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408405