• DocumentCode
    2812945
  • Title

    IC modeling for yield-aware design with variable defect rates

  • Author

    Kumar, Vinu Vijay ; Lach, John

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA, USA
  • fYear
    2005
  • fDate
    Jan. 24-27, 2005
  • Firstpage
    489
  • Lastpage
    495
  • Keywords
    FIR filters; failure analysis; integrated circuit design; integrated circuit testing; IC modeling; benchmark FIR filter design; combinatorial model; component failure; defect rate; design tradeoff; expected quality; semiconductor burn-in test; yield-aware design; Circuit testing; Fabrication; Integrated circuit modeling; Integrated circuit technology; Integrated circuit testing; Integrated circuit yield; Process design; Semiconductor device manufacture; Semiconductor process modeling; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2005. Proceedings. Annual
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-8824-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2005.1408410
  • Filename
    1408410
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2812945