Title :
IC modeling for yield-aware design with variable defect rates
Author :
Kumar, Vinu Vijay ; Lach, John
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA, USA
Keywords :
FIR filters; failure analysis; integrated circuit design; integrated circuit testing; IC modeling; benchmark FIR filter design; combinatorial model; component failure; defect rate; design tradeoff; expected quality; semiconductor burn-in test; yield-aware design; Circuit testing; Fabrication; Integrated circuit modeling; Integrated circuit technology; Integrated circuit testing; Integrated circuit yield; Process design; Semiconductor device manufacture; Semiconductor process modeling; Throughput;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408410
