DocumentCode
2813044
Title
Investigation of X-parameters measurements on a 100 W Doherty power amplifier
Author
Wood, John ; Collins, Gayle
Author_Institution
RF Div., Freescale Semicond. Inc., Tempe, AZ, USA
fYear
2010
fDate
28-28 May 2010
Firstpage
1
Lastpage
7
Abstract
In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.
Keywords
power amplifiers; radiofrequency amplifiers; Agilent N5242A PNA-X; Doherty power amplifier; RF power amplifier IC; high-power reflectometer; nVNA measurements; x-parameters measurements; Broadband amplifiers; Driver circuits; Heart; High power amplifiers; Microwave circuits; Power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
Conference_Location
Anaheim, CA
Print_ISBN
978-1-4244-6364-0
Type
conf
DOI
10.1109/ARFTG.2010.5496319
Filename
5496319
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