A new approach to modelling radiation noise in CCD´s

Author

Chugg, Andrew ; Hopkinson, Gordon

Author_Institution

Radiat. Effects Group, Matra BAe Dynamics, Bristol, UK

fYear

1997

fDate

15-19 Sep 1997

Firstpage

386

Lastpage

391

Abstract

The energy depositions reported by Monte Carlo electron-photon radiation transport codes are subject to a random error due to the finite number of particle histories used to generate the results. These statistical variations, normally a nuisance, may also be identified with the real radiation noise effects experienced by CCD pixels in persistent radiation environments. This paper explores the practicability of such radiation noise modelling by applying the ACCEPT code from the ITS suite to the case of a shielded CCD exposed to an electron flux. The results are compared with those obtained in a subsequent electron irradiation of the CCD by a Van de Graaff accelerator

Keywords

Monte Carlo methods; charge-coupled devices; electron beam effects; semiconductor device models; semiconductor device noise; CCD; ITS ACCEPT code; Monte Carlo electron-photon radiation transport code; electron irradiation; energy deposition; radiation noise model; Charge coupled devices; Electrons; Geometry; History; Monte Carlo methods; Noise level; Probability distribution; Radiation effects; Testing; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on

Conference_Location

Cannes

Print_ISBN

0-7803-4071-X

Type

conf

DOI

10.1109/RADECS.1997.698953

Filename

698953