DocumentCode :
2813109
Title :
Simple plots for monitoring the field reliability of repairable systems
Author :
Trindade, David ; Nathan, Swami
Author_Institution :
Sun Microsyst. Inc., San Jose, CA, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
539
Lastpage :
544
Keywords :
decision making; maintenance engineering; maximum likelihood estimation; reliability; stochastic processes; complex stochastic technique; decision making; maximum likelihood parameter estimation; mean cumulative function; nonhomogeneous Poisson process; reliability monitoring; repairable system; simple plot; statistical method; statistical rigor; Computer network reliability; Computerized monitoring; Condition monitoring; Data analysis; Failure analysis; Hardware; Maintenance; Network servers; Operating systems; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408418
Filename :
1408418
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2813109
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