DocumentCode
2813109
Title
Simple plots for monitoring the field reliability of repairable systems
Author
Trindade, David ; Nathan, Swami
Author_Institution
Sun Microsyst. Inc., San Jose, CA, USA
fYear
2005
fDate
Jan. 24-27, 2005
Firstpage
539
Lastpage
544
Keywords
decision making; maintenance engineering; maximum likelihood estimation; reliability; stochastic processes; complex stochastic technique; decision making; maximum likelihood parameter estimation; mean cumulative function; nonhomogeneous Poisson process; reliability monitoring; repairable system; simple plot; statistical method; statistical rigor; Computer network reliability; Computerized monitoring; Condition monitoring; Data analysis; Failure analysis; Hardware; Maintenance; Network servers; Operating systems; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN
0149-144X
Print_ISBN
0-7803-8824-0
Type
conf
DOI
10.1109/RAMS.2005.1408418
Filename
1408418
Link To Document