• DocumentCode
    2813156
  • Title

    Multimode TRL technique for de-embedding of differential devices

  • Author

    Wojnowski, Maciej ; Issakov, Vadim ; Sommer, Grit ; Weigel, Robert

  • Author_Institution
    Infineon Technol. AG, Neubiberg, Germany
  • fYear
    2010
  • fDate
    28-28 May 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The thru-reflect-line (TRL) is one of the most fundamental and accurate vector network analyzer (VNA) calibration techniques. The multimode TRL calibration method generalizes the standard TRL technique to multimode waveguides. In this paper, the practical use of the multimode TRL calibration technique for de-embedding purposes is discussed. The focus is on the four-port case, since this covers the majority of the practical applications. However, the formulation can be easily extended for networks with higher number of ports. The common de-embedding assumptions such as reciprocity and symmetry are analyzed and their consequences on the multimode TRL algorithm are discussed. It is shown that the reciprocity assumption applied to the embedding networks reduces the requirements on the reflect standard. It is demonstrated that additional assumptions of either identical or symmetrical error networks make it possible to completely resolve the problem related to the reflect standard. Based on the derived formulation, it is shown that the multimode TRL calibration reduces to the traditional TRL de-embedding under reciprocity and symmetry assumptions. The problems of interpretation and re-normalization of the obtained scattering parameters (S-parameters) are also discussed. Finally, the measurement results are presented that verify the multimode TRL approach for de-embedding of four-port differential devices.
  • Keywords
    calibration; cascade systems; network analysers; de-embedding; differential devices; embedding networks; multimode TRL technique; vector network analyzer calibration techniques; Calibration; Circuit stability; Crosstalk; Frequency measurement; Integrated circuit measurements; Integrated circuit noise; Packaging; Probes; Scattering parameters; Semiconductor device modeling; TRL; calibration; de-embedding; differential devices; multimode; on-wafer measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-4244-6364-0
  • Type

    conf

  • DOI
    10.1109/ARFTG.2010.5496326
  • Filename
    5496326