DocumentCode :
2813226
Title :
Early failure detection system for the SAB80C537 microcontroller
Author :
Soto, Enrique ; Marcos, Joao ; Fernandez, S. ; Alvarez, R. ; Barbero, J.
Author_Institution :
Dept. of Electron. Technol., Vigo Univ., Spain
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
572
Lastpage :
576
Keywords :
environmental testing; failure analysis; fault diagnosis; life testing; microcontrollers; military standards; reliability; stress analysis; Infineon SAB80C527 microcontroller; MIL-STD-883E; accelerated environmental test; accelerated life testing; controller board register; failure detection system; harsh environment; personal computer; reliability; serial port; stress test; Character generation; Circuit testing; Control systems; Life estimation; Microcontrollers; Oscillators; Pulse width modulation; Registers; Signal generators; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408424
Filename :
1408424
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2813226
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