• DocumentCode
    2813332
  • Title

    Dual anode electron gun & PPM focusing for Ka-Band TWT

  • Author

    Sharma, RK ; Choudhury, AR ; Sharma, SM ; Arya, S. ; Bera, A. ; Srivastava, V.

  • Author_Institution
    MWT Div., Council of Sci. & Ind. Res. (CSIR), Pilani, India
  • fYear
    2009
  • fDate
    28-30 April 2009
  • Firstpage
    185
  • Lastpage
    186
  • Abstract
    In this paper, a low perveance (0.14 mup) convergent electron gun with dual anodes has been designed using codes EGUN (2D), TRAK (2D), OPERA (3D) and OMNITRAK (3D) for Ka-band helix (TWT) for space applications. Pierce type electron gun with an electrically isolated beam forming electrode (BFE), control anode (A1) and an ion barrier anode (A2) has been opted. An M-type dispenser cathode with low cathode emission loading (~1.0 Amp/cm2), has been selected to ensure the desired long life of more than 10 years and high reliability. To further enhance the life and reliability, non-evaporating type SAES ST-175 getter, has been incorporated in the gun assembly. Application of BFE negative bias of the order of 10 to 20 volts with respect to the cathode is used to achieve the desired beam transmission in the CW tube.
  • Keywords
    anodes; cathodes; electron guns; getters; millimetre wave tubes; permanent magnets; reliability; travelling wave tubes; CW tube; EGUN code; Ka-band helix TWT; M-type dispenser cathode; OMNITRAK code; OPERA code; PPM focusing; Pierce type electron gun; TRAK code; beam transmission; cathode emission loading; control anode; dual anode electron gun; electrically isolated beam forming electrode; gun assembly; ion barrier anode; low perveance convergent electron gun; nonevaporating type SAES ST-175 getter; periodic permanent magnet; reliability; space applications; Anodes; Assembly; Cathodes; Electrodes; Electron beams; Geometry; Magnetic confinement; Magnetic flux; Shape control; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-3500-5
  • Electronic_ISBN
    978-1-4244-3501-2
  • Type

    conf

  • DOI
    10.1109/IVELEC.2009.5193514
  • Filename
    5193514