DocumentCode :
2813732
Title :
Effect of ion bombardment on the field emission of a zinc oxide cathode
Author :
Yunkang Cui ; Xiaobing Zhang ; Wei Lei ; Yunsong Di ; Jinchan Wang ; Xiaxi Yang
Author_Institution :
Sch. of Electron. Sci. & Eng., Southeast Univ., Nanjing, China
fYear :
2009
fDate :
28-30 April 2009
Firstpage :
269
Lastpage :
270
Abstract :
The effects of ion bombardment on the field emission of screen printed tetrapod zinc oxide cathodes are reported. The field emission characteristics of this cathode degrade strongly after Ar ion bombardment for 10 min at an energy of 3 keV and ion current of 5 muA. The emission current density decreases from 1.65 to 0.32 mA/cm2 at 4.50 V/mum field strength, while the turn-on field increases from 2.16 to 3.11 V/mum at a current density of 0.1 muA/cm2. This result demonstrates that the field emission of the ZnO emitters severely degrades upon ion bombardment. The emission degradation can be attributed to a lower value of the field enhancement factor beta, which is caused by changes of the morphology, and a higher work function phi, which is caused by changes of the surface composition of ZnO.
Keywords :
cathodes; current density; electron field emission; vacuum microelectronics; work function; zinc; current 5 muA; emission current density; field emission; field enhancement factor; ion bombardment; screen printed tetrapod zinc oxide cathodes; surface composition; zinc oxide cathode; Argon; Cathodes; Current density; Degradation; Diodes; Displays; Fluid flow; Ion beams; Nanostructures; Zinc oxide; FN-plot; Field emission; Ion bombardment; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3500-5
Electronic_ISBN :
978-1-4244-3501-2
Type :
conf
DOI :
10.1109/IVELEC.2009.5193534
Filename :
5193534
Link To Document :
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