Title :
Comparison and Analysis of the Development in Grading Subjective Tests Algorithms
Author :
Wei, Wei ; Yanchun, Zhao
Author_Institution :
Sch. of Comput. Sci. & Eng., Hebei Univ. of Technol., Tianjin, China
Abstract :
The automatic technology of grading subjective tests is a key issue in network examination. Based on the research of automatic grading subjective tests, this paper elaborates the basic ideas of various algorithms, analyses the advantages and disadvantages. At last, it gives a brief explanation of the problem faced and uses its development for reference.
Keywords :
data mining; pattern recognition; automatic technology; data mining; grading subjective tests algorithms; network examination; pattern recognition; Algorithm design and analysis; Artificial intelligence; Automatic testing; Calculus; Data mining; Intelligent networks; Intelligent systems; Natural languages; Pattern recognition; System testing; automatic grading; sematic; similarity; subjective tests;
Conference_Titel :
Intelligent Networks and Intelligent Systems, 2009. ICINIS '09. Second International Conference on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-5557-7
Electronic_ISBN :
978-0-7695-3852-5
DOI :
10.1109/ICINIS.2009.132
