Title :
Automatic system of measuring dispersion and interaction impedance of Helix SWS
Author :
Liang, Youhuan ; Li, Zhenyuan ; Feng, Jinjun ; Zhao, Shilu ; Yan, Tiechang
Author_Institution :
Vacuum Electron. Nat. Lab., Beijing Vacuum Electron. Res. Inst., Beijing, China
Abstract :
In order to obtain the parameters of dispersion and interaction impedance of helix slow-wave structure (SWS), an automatic system was established. A non-resonant perturbation model was employed in the system. The helix SWS under measurement is 1:1 model of practical helix SWS. The hardware of the system is mainly composed of Vector Network Analyzer (VNA), personal computer (PC), moving platform, controller and optical monitor. The special program was developed to control the measure progress and manage the data. The experimental results were in good agreement with the results calculated using Microwave Studio.
Keywords :
dispersion (wave); electric impedance measurement; electronic engineering computing; slow wave structures; Microwave Studio; dispersion measurement; helix SWS; helix slow-wave structure; interaction impedance; nonresonant perturbation model; Automatic control; Dispersion; Frequency measurement; Hardware; Impedance measurement; Optical control; Probes; Propagation constant; Vacuum systems; Wire; automatic measure; dispersion; helix SWS; interaction impedance; non-resonant perturbation;
Conference_Titel :
Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3500-5
Electronic_ISBN :
978-1-4244-3501-2
DOI :
10.1109/IVELEC.2009.5193557
