• DocumentCode
    281435
  • Title

    The quantum Hall effect and the ohm

  • Author

    Hartland, A. ; Jones, R.G. ; Legg, D.J.

  • Author_Institution
    Div. of Electr. Sci., NPL, Teddington, UK
  • fYear
    1989
  • fDate
    32528
  • Abstract
    The authors discuss the development of resistance standards based on the quantum Hall effect. The first measurements had a fractional uncertainty >5×10-6, but subsequent experiments in the major national standards laboratories have refined the measurements in different semiconducting materials, particularly the gallium arsenide-aluminium gallium arsenide heterostructure, to such an extent that reproducibilities of 5×10-9 are routinely available
  • Keywords
    III-V semiconductors; aluminium compounds; electric resistance measurement; gallium arsenide; measurement standards; p-n heterojunctions; quantum Hall effect; GaAs-AlGaAs; III-V semiconductor; national standards laboratories; ohm; p-n heterostructure; quantum Hall effect; resistance standards;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Changes in the Value of the UK National Reference Standards for the Volt and the Ohm, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    197733