• DocumentCode
    28145
  • Title

    A Prescription for Sub-Millimeter-Wave Transistor Characterization

  • Author

    Williams, Dylan F. ; Young, A.C. ; Urteaga, M.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    3
  • Issue
    4
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    433
  • Lastpage
    439
  • Abstract
    In this paper, we present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave wavelengths. We demonstrate the approach at frequencies up to 750 GHz and estimate the uncertainty of the procedure.
  • Keywords
    microstrip lines; organic semiconductors; semiconductor thin films; submillimetre wave transistors; BCB monomers film; microstrip lines; submillimeter-wave transistor characterization; submillimeter-wave wavelengths; thin bisbenzocyclobutene-based monomers; BCB-based monomers; bisbenzocyclobutene (BCB); calibration; scattering parameters; sub-millimeter-wave; transistor; uncertainty; vector network analyzer;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2013.2255332
  • Filename
    6504820