Title :
A Prescription for Sub-Millimeter-Wave Transistor Characterization
Author :
Williams, Dylan F. ; Young, A.C. ; Urteaga, M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
In this paper, we present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave wavelengths. We demonstrate the approach at frequencies up to 750 GHz and estimate the uncertainty of the procedure.
Keywords :
microstrip lines; organic semiconductors; semiconductor thin films; submillimetre wave transistors; BCB monomers film; microstrip lines; submillimeter-wave transistor characterization; submillimeter-wave wavelengths; thin bisbenzocyclobutene-based monomers; BCB-based monomers; bisbenzocyclobutene (BCB); calibration; scattering parameters; sub-millimeter-wave; transistor; uncertainty; vector network analyzer;
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
DOI :
10.1109/TTHZ.2013.2255332
