Title :
Modal expansion analysis of discrete source scattering by a spherically stratified lens
Author :
Sanford, J. ; Angehrn, U.
Author_Institution :
Huber & Suhner AG, Herisau, Switzerland
Abstract :
An eigenfunction expansion into the standard vector spherical wave functions is used to compute the scattering of electromagnetic radiation by a spherically stratified object. The incident field is that of an infinitesimal current element (a point source) and not a plane wave. Its expansion coefficients are obtained by matching the far field. The coefficients for the scattered fields are then determined from the boundary conditions at each interface, at the origin and at infinity. This analysis is employed to determine the radiation properties of a dielectric lens at microwave frequencies. The work is extended to include the scattering of other sources such as horns and microstrip patches which are then used in conjunction with the lens to form a multiple-beam antenna.<>
Keywords :
dielectric devices; eigenvalues and eigenfunctions; electromagnetic field theory; electromagnetic wave scattering; lens antennas; vectors; wave functions; waveguide antennas; EM wave scattering; boundary conditions; dielectric lens; discrete source scattering; eigenfunction expansion; electromagnetic radiation; expansion coefficients; horns; incident field; interface; microstrip patches; microwave frequencies; modal expansion analysis; multiple-beam antenna; point source; radiation properties; scattered fields; spherically stratified lens; vector spherical wave functions; Boundary conditions; Dielectrics; Eigenvalues and eigenfunctions; Electromagnetic radiation; Electromagnetic scattering; H infinity control; Lenses; Microstrip antennas; Microwave frequencies; Wave functions;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1991. AP-S. Digest
Conference_Location :
London, Ontario, Canada
Print_ISBN :
0-7803-0144-7
DOI :
10.1109/APS.1991.175221
