DocumentCode
2814801
Title
Framework for Quantitative S/W Development Performance Measurement and Analysis in Semiconductor Industry
Author
Song, Ki-won ; Lee, Soo-Hwan ; Jang, Young-Gyun ; Suh, Il-Seok ; Kim, Jin-Soo
Author_Institution
Syst. LSI Div., SAMSUNG Electron. CO., Ltd., Daegu
fYear
2008
fDate
28-30 Aug. 2008
Firstpage
739
Lastpage
746
Abstract
This paper presents a framework for quantitative software development performance measurement and analysis based on characteristics of software in system on chip (SoC) industry, one of the semiconductor businesses. In this paper, we propose a measurement model based on not only theoretical model (Performance Pyramid) but also characteristics of SoC embedded software. The paper also presents surroundings of the model - a measurement process, an infrastructure and its constituent units, and Key Performance Indicators (KPIs), which are the basis of the quantitative software development performance measurement. Quantitative software development performance measurement is not just collecting indicators but analyzing quality, cost, and delivery (QCD) of collected indicators. This makes possible both external effectiveness and internal efficiency. Externally, it is possible for programmers to develop software meeting customers´ needs. Internally, more efficient software development can be possible through the visible productivity increase.
Keywords
electronic engineering computing; electronics industry; system-on-chip; SoC embedded software; SoC industry; key performance indicators; quantitative software development; system-on-chip; Computer industry; Electronics industry; Embedded software; Performance analysis; Programming; Semiconductor device measurement; Software measurement; Software performance; Software systems; System-on-a-chip; GQM; KPI; Metrics; Opportunity Tree; SoC S/W Performance Measure;
fLanguage
English
Publisher
ieee
Conference_Titel
Convergence and Hybrid Information Technology, 2008. ICHIT '08. International Conference on
Conference_Location
Daejeon
Print_ISBN
978-0-7695-3328-5
Type
conf
DOI
10.1109/ICHIT.2008.198
Filename
4622916
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