DocumentCode
2815280
Title
Low threshold electrically pumped red emitting InP/Al0.20 GaInP quantum dot vertical microcavity laser
Author
Jetter, M. ; Eichfelder, M. ; Schulz, W-u ; Reischle, M. ; Wiesner, M. ; Rossbach, R. ; Michler, P.
Author_Institution
Inst. fur Halbleiteroptik und Funktionelle Grenzflachen, Univ. Stuttgart, Stuttgart, Germany
fYear
2009
fDate
14-19 June 2009
Firstpage
1
Lastpage
1
Abstract
In this contribution we report on the fabrication and the emission characteristics of electrically pumped QDs embedded in monolithically grown microcavity p-i-n-diode structures in the InP/AlGalnP material system. By incorporation of an oxide aperture with small diameter the current path in the QD VCSEL was strongly confined so that optical transverse modes appear. We can clearly see the laser emission line at around 1.9 eV at room temperature. High-resolution electroluminescence (EL) measurements of the peak resolve clearly a large number of higher transverse modes at the high energy side of the fundamental laser mode. Further lasers also with smaller oxide aperture diameters show similar behavior, but with larger transverse mode spacing as expected for smaller mode volumes.
Keywords
III-V semiconductors; aluminium compounds; electroluminescence; gallium compounds; indium compounds; laser modes; microcavity lasers; optical pumping; p-i-n photodiodes; quantum dot lasers; semiconductor quantum dots; surface emitting lasers; InP-Al0.20GaInP; QD VCSEL; electron volt energy 1.9 eV; emission characteristics; fundamental laser mode; high-resolution electroluminescence measurement; low threshold electrically pumping; monolithically grown microcavity p-i-n-diode; optical transverse mode; oxide aperture; semiconductor quantum dot; Apertures; Indium phosphide; Laser modes; Microcavities; Optical device fabrication; Optical materials; Optical pumping; Pump lasers; Stimulated emission; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-4079-5
Electronic_ISBN
978-1-4244-4080-1
Type
conf
DOI
10.1109/CLEOE-EQEC.2009.5193615
Filename
5193615
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