DocumentCode :
2815401
Title :
A fast circuit model for interaction of open-ended rectangular waveguide probes with surface long cracks in metals
Author :
Ahanian, I. ; Sadeghi, S.H.H. ; Moini, R.
Author_Institution :
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
fYear :
2011
fDate :
22-24 Feb. 2011
Firstpage :
57
Lastpage :
59
Abstract :
This paper proposes a modeling technique that predicts the output signal of an open-ended rectangular waveguide probe when scanning a long crack. The technique is based on a circuit approximation model and hence remarkably reduces the computation burden. In this model, the waveguide probe is replaced with a transmission line, the crack is replaced with a shorted transmission line, and the interface between the probe and the crack is replaced with an appropriate impedance. The validity of the proposed model is demonstrated by comparing the simulation results of several case studies with those obtained using a commercial finite integration technique code.
Keywords :
fatigue cracks; metals; rectangular waveguides; surface cracks; circuit approximation model; commercial finite integration technique code; fast circuit model; impedance; metals; open-ended rectangular waveguide probes; surface long cracks; transmission line; Computational modeling; Integrated circuit modeling; Power transmission lines; Probes; Rectangular waveguides; Surface cracks; Surface impedance; Circuit model; Nondestructive evaluation; Surface crack; Waveguide probe;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors Applications Symposium (SAS), 2011 IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-8063-0
Type :
conf
DOI :
10.1109/SAS.2011.5739824
Filename :
5739824
Link To Document :
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