• DocumentCode
    2815535
  • Title

    Low frequency characterization of partially filled gratings-TE case

  • Author

    Barkeshli, K.

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 July 1996
  • Firstpage
    497
  • Abstract
    We derive analytical expressions for various fundamental parameters of an electrically narrow rectangular grating. These include tangential electric field over the aperture, equivalent admittance, aperture voltage and the reflection coefficient for the dominant Floquet mode. The grooves are assumed to be partially (or completely) filled with a lossy material. The loading material is simulated by applying the standard impedance boundary condition.
  • Keywords
    diffraction gratings; electric admittance; electric fields; electric impedance; electromagnetic wave reflection; electromagnetic wave scattering; waveguide theory; TE waves; analytical expressions; aperture; aperture voltage; current density distribution; dominant Floquet mode; electrically narrow rectangular grating; equivalent admittance; full wave integral equation; impedance boundary condition; loading material; lossy material; low frequency characterization; magnetic current density; parameters; partially filled gratings; periodic grooves; reflection coefficient; resistive strip gratings; scattering characteristics; tangential electric field; Admittance; Apertures; Boundary conditions; Computer aided software engineering; Dielectric materials; Frequency; Gratings; Reflection; Strips; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-3216-4
  • Type

    conf

  • DOI
    10.1109/APS.1996.549646
  • Filename
    549646