Title :
The Influence of Front-End Electronics on Parameters of X-Ray Scanning System
Author :
Rjabkov, S.A. ; Nam, I.F. ; Tyazhev, A.V. ; Rozhnev, M.A. ; Nadreev, I.I. ; Lelekov, M.A.
Author_Institution :
RID Ltd., Tomsk
Abstract :
The given work is devoted to studying of an opportunity of application front-end electronics developed for work with IR receivers for GaAs-detectors of X-ray radiation (Ayzenshtat et al., 2003), an estimation of influence of parameters front-end electronics on parameters of all system. The experiments on detecting units which have identical detectors and various front-end chips have been led during the work.
Keywords :
III-V semiconductors; X-ray detection; X-ray imaging; gallium arsenide; GaAs - Interface; IR detectors; IR receivers; X-ray scanning system; dynamic range; front-end electronics; sensitivity; Communication system control; Control systems; Crosstalk; Dynamic range; Infrared detectors; Object detection; Production systems; Radiation detectors; X-ray detection; X-ray detectors; Front-end chip; GaAs-detectors; X-ray detectors; dynamic range; noise; sensitivity;
Conference_Titel :
Control and Communications, 2007. SIBCON '07. Siberian Conference on
Conference_Location :
Tomsk
Print_ISBN :
1-4244-0346-4
DOI :
10.1109/SIBCON.2007.371334
