Title :
Multiple-frequency thickness-mode thin-film piezoelectric-on-substrate filter array
Author :
Pan, Wanling ; Ayazi, Farrokh
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
Abstract :
An approach to build thin-film piezoelectric-on-substrate (TPoS) filters working at different frequencies on the same wafer is proposed. In this approach, filters with different substrate layer thicknesses working at different orders of resonance are used. The insertion loss for each thickness and mode is predicted by introducing damping elements in the material constants used in Masonpsilas model simulations. In a first demonstration, ZnO-on-Si filters with different Si layer thicknesses are fabricated and tested. Measurement results are in good agreement with simulations. Several filters with low insertion loss at different frequencies are fabricated on the same wafer.
Keywords :
II-VI semiconductors; crystal filters; damping; piezoelectric thin films; resonance; silicon; thin film devices; wide band gap semiconductors; zinc compounds; Mason´s model simulations; Si; ZnO-Si; ZnO-on-silicon filters; damping elements; low insertion loss; multiple-frequency thickness-mode filter array; resonance; silicon substrate layer thickness; thin-film piezoelectric-on-substrate filter fabrication; Damping; Filters; Frequency; Insertion loss; Piezoelectric films; Predictive models; Resonance; Semiconductor device modeling; Substrates; Testing;
Conference_Titel :
Frequency Control Symposium, 2008 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1794-0
Electronic_ISBN :
1075-6787
DOI :
10.1109/FREQ.2008.4623001