DocumentCode
2816228
Title
Multiple-frequency thickness-mode thin-film piezoelectric-on-substrate filter array
Author
Pan, Wanling ; Ayazi, Farrokh
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear
2008
fDate
19-21 May 2008
Firstpage
259
Lastpage
262
Abstract
An approach to build thin-film piezoelectric-on-substrate (TPoS) filters working at different frequencies on the same wafer is proposed. In this approach, filters with different substrate layer thicknesses working at different orders of resonance are used. The insertion loss for each thickness and mode is predicted by introducing damping elements in the material constants used in Masonpsilas model simulations. In a first demonstration, ZnO-on-Si filters with different Si layer thicknesses are fabricated and tested. Measurement results are in good agreement with simulations. Several filters with low insertion loss at different frequencies are fabricated on the same wafer.
Keywords
II-VI semiconductors; crystal filters; damping; piezoelectric thin films; resonance; silicon; thin film devices; wide band gap semiconductors; zinc compounds; Mason´s model simulations; Si; ZnO-Si; ZnO-on-silicon filters; damping elements; low insertion loss; multiple-frequency thickness-mode filter array; resonance; silicon substrate layer thickness; thin-film piezoelectric-on-substrate filter fabrication; Damping; Filters; Frequency; Insertion loss; Piezoelectric films; Predictive models; Resonance; Semiconductor device modeling; Substrates; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2008 IEEE International
Conference_Location
Honolulu, HI
ISSN
1075-6787
Print_ISBN
978-1-4244-1794-0
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2008.4623001
Filename
4623001
Link To Document