• DocumentCode
    2816228
  • Title

    Multiple-frequency thickness-mode thin-film piezoelectric-on-substrate filter array

  • Author

    Pan, Wanling ; Ayazi, Farrokh

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    19-21 May 2008
  • Firstpage
    259
  • Lastpage
    262
  • Abstract
    An approach to build thin-film piezoelectric-on-substrate (TPoS) filters working at different frequencies on the same wafer is proposed. In this approach, filters with different substrate layer thicknesses working at different orders of resonance are used. The insertion loss for each thickness and mode is predicted by introducing damping elements in the material constants used in Masonpsilas model simulations. In a first demonstration, ZnO-on-Si filters with different Si layer thicknesses are fabricated and tested. Measurement results are in good agreement with simulations. Several filters with low insertion loss at different frequencies are fabricated on the same wafer.
  • Keywords
    II-VI semiconductors; crystal filters; damping; piezoelectric thin films; resonance; silicon; thin film devices; wide band gap semiconductors; zinc compounds; Mason´s model simulations; Si; ZnO-Si; ZnO-on-silicon filters; damping elements; low insertion loss; multiple-frequency thickness-mode filter array; resonance; silicon substrate layer thickness; thin-film piezoelectric-on-substrate filter fabrication; Damping; Filters; Frequency; Insertion loss; Piezoelectric films; Predictive models; Resonance; Semiconductor device modeling; Substrates; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2008 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-1794-0
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2008.4623001
  • Filename
    4623001