• DocumentCode
    2816238
  • Title

    Octave band InGaAs HEMT MMIC LNAs to 40 GHz

  • Author

    Nelson, B. ; Jones, W. ; Archer, E. ; Allen, B. ; DuFault, M. ; Streit, D. ; Liu, P. ; Oshita, F.

  • Author_Institution
    TRW Inc., Redondo Beach, CA, USA
  • fYear
    1990
  • fDate
    7-10 Oct. 1990
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    Design and development of three broadband balanced two-stage low-noise amplifiers (LNAs) are presented and a discrete InGaAs HEMT device noise model is included that implements correlated spectral noise sources with supporting noise parameter data. Three amplifiers that cover the 5-11 GHz, 9-19 GHz and 26-40 GHz frequency bands have been developed, and achieved noise figures of 2.2 dB, 2.5 dB, and 4.75 dB with gains of 23 dB, 19 dB, and 20 dB, respectively, at room temperature. The VSWRs of these LNAs are less than 1.5:1 over their full bands. These two-stage designs offer new capabilities in broadband noise measure and gain. The low-noise fabrication process has achieved 30% RF yield. The combination of a comprehensive device model, process-tolerant circuit design, and proven fabrication process makes the realization of low-cost broadband low-noise amplifiers practical.<>
  • Keywords
    MMIC; electron device noise; gallium arsenide; high electron mobility transistors; indium compounds; microwave amplifiers; wideband amplifiers; 19 dB; 2.2 dB; 2.5 dB; 20 dB; 23 dB; 26 to 40 GHz; 4.75 dB; 5 to 11 GHz; 9 to 19 GHz; HEMT; InGaAs; LNAs; RF yield; VSWRs; broadband balanced two-stage low-noise amplifiers; broadband noise measure; correlated spectral noise sources; device noise model; fabrication process; noise parameter data; octave band; process-tolerant circuit design; Broadband amplifiers; Fabrication; Frequency; Gain; HEMTs; Indium gallium arsenide; Low-noise amplifiers; MMICs; Noise figure; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual
  • Conference_Location
    New Orleans, LA, USA
  • Type

    conf

  • DOI
    10.1109/GAAS.1990.175477
  • Filename
    175477