DocumentCode
281630
Title
Can reliability mean a life-time operation without a failure?
Author
Qureshi, U.
fYear
1989
fDate
32577
Firstpage
42430
Lastpage
42433
Abstract
The increased use of complex and application specific integrated circuits has led to a dramatic reduction in component count, with a substantial improvement in reliability. It is suggested that knowledge exists to improve the design and manufacturing process to make zero defects a realistic target. Software correction techniques for measurement and calibration have played an important role in improving both reliability and performance. Future innovations will be directed towards producing smart instruments which automatically prevent misuse and eliminate avoidable errors
fLanguage
English
Publisher
iet
Conference_Titel
Reliable Electronic Measurements, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
198011
Link To Document