• DocumentCode
    281630
  • Title

    Can reliability mean a life-time operation without a failure?

  • Author

    Qureshi, U.

  • fYear
    1989
  • fDate
    32577
  • Firstpage
    42430
  • Lastpage
    42433
  • Abstract
    The increased use of complex and application specific integrated circuits has led to a dramatic reduction in component count, with a substantial improvement in reliability. It is suggested that knowledge exists to improve the design and manufacturing process to make zero defects a realistic target. Software correction techniques for measurement and calibration have played an important role in improving both reliability and performance. Future innovations will be directed towards producing smart instruments which automatically prevent misuse and eliminate avoidable errors
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Reliable Electronic Measurements, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    198011